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ST-4080
Product number : ST-4080
 
Size : 500 x 610 x 640 mm
 
 
Product explain

ST4080-OSP (organic solderability protective film) designed to measure PCB / PW board surface of copper OSP thickness. As a reflection method using non-destructive spectral optical measuring instrument, which provides an average thickness of the outline and detailed 3D surface data, making real-time detection without any sample preparation. As ST4080-OSP has a very small area of ​​measurement and auto-focus for the actual PCB substrate surface measurements. ST4080-OS measurement technology is in use K-MAC optical analysis measurement techniques, and it is in the semiconductor, flat panel displays and other electronic materials industry in reliability has been confirmed.

Measurement Wavelength Range:420nm~640nm
Measurable Thickness Range:1000Å~1.5㎛
Layer Measurement:1 layer
Spot Size:1.35㎛, 0.135㎛

 
 
 
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