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ST-6000
Product number : ST-6000
 
Size : Customized
 
 
Product explain

Multi-layer measurement system, other types of multilayer film measurement, providing services to multi-point measurements. Complex features: color meter, Contact angle, RS Meter, transmittance measurements, Critical Dimension

Measuring range:

Measurement Wavelength Range:400 ~ 800 nm
Measurable Thickness Range:100Å ~ 35μm (depending on material)
Multi-layer Measurement:Up to 3 layers
Spot Size:40㎛ (5X), 20㎛ (10X), 4㎛(50X)

 

 
 
 
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